

An edition of Proceedings (1999)
Proceedings
By IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (1999 Albuquerque, N.M.),IEEE Computer Society,Institute of Electrical and Electronics Engineers
Publish Date
January 1999
Publisher
Institute of Electrical & Electronics Enginee
Language
eng
Pages
390
Description:
subjects: Congresses, Very large scale integration, Design and construction, Integrated circuits, Fault-tolerant computing, Systems management, Electronic Measurements, Very-Large-Scale Integration (Vlsi), Technology & Engineering, Computers - General Information, Science/Mathematics, General, Electronics - Circuits - VLSI, Engineering - Electrical & Electronic