Semiconductor Devices in Harsh Conditions

An edition of Semiconductor Devices in Harsh Conditions (2016)

Semiconductor Devices in Harsh Conditions

By Kirsten Weide-Zaage,Malgorzata Chrzanowska-Jeske

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Publish Date

2016

Publisher

Taylor & Francis Group

Language

eng

Pages

234

Description:

subjects: Semiconductors, Extreme environments, Environmental testing, Reliability, Semi-conducteurs, Fiabilité, Milieux extrêmes, Essais d'environnement, Accelerated weathering