Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching

An edition of Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching (2006)

Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching

Application to Rough and Natural Surfaces

By Gerd Kaupp

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Publish Date

2010

Publisher

Springer Berlin / Heidelberg

Language

eng

Pages

Description:

subjects: Scanning tunneling microscopy