The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon
An edition of The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon (1977)
By Sheng S. Li
Publish Date
1977
Publisher
U.S. Dept. of Commerce, National Bureau of Standards ; for sale by the Supt. of Docs., U.S. Govt. Print. Off.
Language
eng
Pages
28
Description: