1-24 of 205 Books

Machinerys Handbook
By Erik Oberg,E. Oberg,F.D. Jones,Christopher McCauley,Franklin Day Jones,Holbrook L. Horton,Henry H. Ryffel,Ricardo Heald,Robert Green

Industrial fluid power
By Charles S. Hedges,Robert C. Womack

System dynamics
By Dean Karnopp,Dean C. Karnopp,Donald L. Margolis,Ronald C. Rosenberg

The Russian theory of activity
By G. Z. Bednyĭ,Gregory Bedny,David Meister

Machining Fundamentals
By John R. Walker,John R. Walker

Gas cyclones and swirl tubes
By Alex C. Hoffmann,Louis E. Stein

Job hazard analysis
By James E. Roughton,James Roughton,Nathan Crutchfield

Calcium signalling in cancer
By G. V. Sherbet,Amalendu Mukherjee,Ranjit Karmakar

Project management of complex and embedded systems
By Kim H. Pries,Kim H. Pries,Jon M. Quigley

TPM for the lean factory
By Kenʼichi Sekine,Keniche Sekine,Keisuke Arai

Machinery's Handbook
By Franklin Day Jones,Henry H. Ryffel,Erik Oberg,Christopher McCauley,Ricardo Heald

CMMI survival guide
By Suzanne Garcia,Richard Turner

Product development
By Anil Mital,Anoop Desai,Anand Subramanian,Aashi Mital

Evaluation and decision models
By Denis Bouyssou,Thierry Marchant,Marc Pirlot,Patrice Perny,Alexis Tsoukias,P. Vincke

Computer aided design
By José Luis Encarnação,Jose L. Encarnacao,Rolf Lindner,Ernst G. Schlechtendahl

Multiple criteria decision analysis
By Valerie Belton,Theodor J. Stewart

Enhanced characterization and representation of flow through karst aquifers
By Scott L. Painter,Sun, Alexander.,Ronald T. Green

Models & methods for project selection
By Samuel B. Graves,Jeffrey L. Ringuest

Welding robots
By J. Norberto Pires,Altino Loureiro,Gunnar Bolmsjö

Process management
By J. A. de Bruijn,Hans de Bruijn,Ernst ten Heuvelhof,Roel J. in 't Veld

The governance of innovation in Europe
By Philip Cooke,Patries Boekholt,Franz Todling

Mass customization and footwear
By Claudio R. Boër,Sergio Dulio

Practical lean accounting
By Brian H Maskell,Brian H. Maskell,Bruce Baggaley

What every engineer should know about risk engineering and management
By John X. Wang,Marvin L. Roush