1-24 of 139 Books
Integrated pollution control licensing
Integrated pollution control licensing
By Ireland. Environmental Protection Agency.

Competitive-cum-Cooperative Interfirm Relations and Dynamics in the Japanese Semiconductor Industry
By Yoshitaka Okada
Smart Power Economics, Technology, and Applications
Smart Power Economics, Technology, and Applications
By Marvin W. Smith
The McClean report
The McClean report
By William J. McClean
The EDA vendor directory
The EDA vendor directory
By Bruce P. Hadburg

Alliances entre firmes et course technologique
By Emmanuel Combe
Erasable programmable read only memories from Japan
Erasable programmable read only memories from Japan
By United States International Trade Commission

Integrated processing for micro- and optoelectronics
By Symposium D on Integrated Processing for Micro- and Optoelectronics (1993 Strasbourg, France),Symposium d on Beam Processing and Laser Chemistry,Avishay Katz,Yves I. Nissim
Selected aspects of microelectronics technology and applications
Selected aspects of microelectronics technology and applications
By Jon Sigurdson
DSP strategies for the '90s
DSP strategies for the '90s
By William I. Strauss
Zhongguo da lu fa zhan IC she ji chan ye dui Taiwan ye zhe de ying xiang =
Zhongguo da lu fa zhan IC she ji chan ye dui Taiwan ye zhe de ying xiang =
By Peiying Li
Sentan gijutsu to kore kara no chūshō kigyō
Sentan gijutsu to kore kara no chūshō kigyō
By Kinoshita, Taketo
You Zhongguo da lu fa zhan ban dao ti chan ye kan liang an jing yuan dai gong de jing he =
You Zhongguo da lu fa zhan ban dao ti chan ye kan liang an jing yuan dai gong de jing he =
By
In the matter of certain plastic encapsulated integrated circuits
In the matter of certain plastic encapsulated integrated circuits
By United States International Trade Commission.

Environmental, Safety, and Health Issues in Ic Production
By Rafael Reif
Sekai no IC seisan kichi Shirikon airando
Sekai no IC seisan kichi Shirikon airando
By

The worldwide IC wafer fabrication foundry market
By Bertil C. Lindberg

Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III
By Damon Debusk