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materials microscopy

1-24 of 85 Books

View Microstructural characterization of materials By D. G. Brandon,David D. Brandon,Wayne D. Kaplan
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Microstructural characterization of materials

By D. G. Brandon,David D. Brandon,Wayne D. Kaplan

View Handbook of microscopy By S. Amelinckx
Cover of Handbook of microscopy by s. amelinckx

Handbook of microscopy

By S. Amelinckx

View Miniaturized Testing of Engineering Materials By V. Karthik,K. V. Kasiviswanathan,Baldev Raj

Miniaturized Testing of Engineering Materials

Miniaturized Testing of Engineering Materials

By V. Karthik,K. V. Kasiviswanathan,Baldev Raj

View Microscopy of Semiconducting Materials By A. G. Cullis
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Microscopy of Semiconducting Materials

By A. G. Cullis

View Applied scanning probe methods VII By Bharat Bhushan
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Applied scanning probe methods VII

By Bharat Bhushan

View Reflection Electron Microscopy and Spectroscopy for Surface Analysis By Zhong Lin Wang
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Reflection Electron Microscopy and Spectroscopy for Surface Analysis

By Zhong Lin Wang

View Transmission electron microscopy By David B. Williams
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Transmission electron microscopy

By David B. Williams

View High resolution electron microscopy of defects in materials By Robert Sinclair,David J. Smith (undifferentiated)
Cover of High resolution electron microscopy of defects in materials by robert sinclair,david j. smith (undifferentiated)

High resolution electron microscopy of defects in materials

By Robert Sinclair,David J. Smith (undifferentiated)

View Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas By Channing C. Ahn

Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas

Transmission Electron Energy Loss Spectrometry in Materials Science and the EELS Atlas

By Channing C. Ahn

View Applied Scanning Probe Methods III By Bharat Bhushan
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Applied Scanning Probe Methods III

By Bharat Bhushan

View Applied Scanning Probe Methods X By Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
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Applied Scanning Probe Methods X

By Bharat Bhushan,Harald Fuchs,Masahiko Tomitori

View Applied Scanning Probe Methods IX By Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
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Applied Scanning Probe Methods IX

By Bharat Bhushan,Harald Fuchs,Masahiko Tomitori

View Applied Scanning Probe Methods VIII By Bharat Bhushan,Harald Fuchs,Masahiko Tomitori
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Applied Scanning Probe Methods VIII

By Bharat Bhushan,Harald Fuchs,Masahiko Tomitori

View Scanning Probe Microscopy�in Industrial Applications By Dalia G. Yablon

Scanning Probe Microscopy�in Industrial Applications

Scanning Probe Microscopy�in Industrial Applications

By Dalia G. Yablon

View Impact of Electron and Scanning Probe Microscopy on Materials Research By Giovanni Valdre,Ugo Valdre
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Impact of Electron and Scanning Probe Microscopy on Materials Research

By Giovanni Valdre,Ugo Valdre

View Applied Scanning Probe Methods VI By Bharat Bhushan,Satoshi Kawata

Applied Scanning Probe Methods VI

Applied Scanning Probe Methods VI

By Bharat Bhushan,Satoshi Kawata

View Mössbauer Spectroscopy in Materials Science By Marcel Miglierini
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Mössbauer Spectroscopy in Materials Science

By Marcel Miglierini

View Material research in atomic scale by Mössbauer spectroscopy By NATO Advanced Research Workshop on Material Research in Atomic Scale by Mössbauer Spectroscopy (2002 Smolenice, Slovakia)
Cover of Material research in atomic scale by Mössbauer spectroscopy by nato advanced research workshop on material research in atomic scale by mössbauer spectroscopy (2002 smolenice, slovakia)

Material research in atomic scale by Mössbauer spectroscopy

By NATO Advanced Research Workshop on Material Research in Atomic Scale by Mössbauer Spectroscopy (2002 Smolenice, Slovakia)

View Applied Scanning Probe Methods XIII By Phaedon Avouris,Bharat Bhushan,Dieter Bimberg,Harald Fuchs,Klaus von Klitzing,Hiroyuki Sakaki,R. Wiesendanger
Cover of Applied Scanning Probe Methods XIII by phaedon avouris,bharat bhushan,dieter bimberg,harald fuchs,klaus von klitzing,hiroyuki sakaki,r. wiesendanger

Applied Scanning Probe Methods XIII

By Phaedon Avouris,Bharat Bhushan,Dieter Bimberg,Harald Fuchs,Klaus von Klitzing,Hiroyuki Sakaki,R. Wiesendanger

View Electrically Based Microstructural Characterization III By Gyeong Man Choi
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Electrically Based Microstructural Characterization III

By Gyeong Man Choi

View Materials Problem Solving with the Transmission Electron Microscope By L. W. Hobbs,D. B. Williams

Materials Problem Solving with the Transmission Electron Microscope

Materials Problem Solving with the Transmission Electron Microscope

By L. W. Hobbs,D. B. Williams

View Impact of electron and scanning probe microscopy on materials research By David G. Rickerby
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Impact of electron and scanning probe microscopy on materials research

By David G. Rickerby

View Electron backscatter diffraction in materials science By Adam J. Schwartz
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Electron backscatter diffraction in materials science

By Adam J. Schwartz

View Microscopy of materials By D. Keith Bowen
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Microscopy of materials

By D. Keith Bowen