A simple method of obtaining concentration depth-profiles from X-ray diffraction

An edition of A simple method of obtaining concentration depth-profiles from X-ray diffraction (1984)

A simple method of obtaining concentration depth-profiles from X-ray diffraction

By Karl E. Wiedemann

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Publish Date

1984

Publisher

Metallurgical Society of AIME,National Aeronautics and Space Administration,National Technical Information Service, distributor

Language

eng

Pages

Description:

subjects: Convolution integrals, Diffraction patterns, X ray diffraction, Luminous intensity, Depth measurement