Design and analysis of multilayer x-ray/XUV microscope

final report

By David L. Shealy

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Publish Date

1990

Publisher

University of Alabama at Birmingham, Dept. of Physics ; [Washington, D.C.,National Aeronautics and Space Administration,National Technical Information Service, distributor

Language

eng

Pages

Description:

subjects: Image resolution, Extreme ultraviolet radiation, Mirrors, X rays, Ultraviolet microscopy, Optical microscopes