Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films

An edition of Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films (1978)

Apparatus for simultaneous measurement of mass change, optical transmittance, and reflectance of thin films

By Alvin Warren Czanderna

0 (0 Ratings)

0 Want to read0 Currently reading0 Have read

Publish Date

1978

Publisher

Dept. of Energy, Division of Solar Technology

Language

eng

Pages

Description:

subjects: Measurement, Optical properties, Thin films, Specular reflectance, Mass (Physics)