Reliability and hot-electron effects in analog and mixed-mode circuits

An edition of Reliability and hot-electron effects in analog and mixed-mode circuits (1993)

Reliability and hot-electron effects in analog and mixed-mode circuits

By David Ying Ge

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Publish Date

1993

Publisher

Language

eng

Pages

Description:

subjects: Metal oxide semiconductor field-effect transistors, Reliability, Hot carriers, Integrated circuits, Differential amplifiers