Development of a semi-automatic Beta-backscatter thickness-measuring system

An edition of Development of a semi-automatic Beta-backscatter thickness-measuring system (1979)

Development of a semi-automatic Beta-backscatter thickness-measuring system

final report

By R. V. Heckman

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Publish Date

1979

Publisher

Dept. of Energy,for sale by the National Technical Information Service]

Language

eng

Pages

Description:

subjects: Beta rays, Minicomputers, Thickness measurement, Scattering