Enhanced accuracy time domain reflection and transmission measurements for IC interconnect characterization

An edition of Enhanced accuracy time domain reflection and transmission measurements for IC interconnect characterization (1994)

Enhanced accuracy time domain reflection and transmission measurements for IC interconnect characterization

By Dmitry A. Smolyansky

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Publish Date

1994

Publisher

Language

eng

Pages

Description:

subjects: Reliability, Time-domain reflectometry, Integrated circuits, Measurement