Fault-sensitivity and wear-out analysis of VLSI sensitivity

By Gwan Seung Choi

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Publish Date

1994

Publisher

Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign,National Aeronautics and Space Administration,National Technical Information Service, distributor

Language

eng

Pages

Description:

subjects: Chips (Electronics), Failure analysis, Monte Carlo method, Statistical analysis, Switching circuits, Very large scale integration