Secondary Ion Mass Spectrometry

SIMS IX

By International Conference on Secondary Ion Mass Spectrometry (9th 1993 Yokahama),A. Benninghoven,Y. Nihei,R. Shimizu

0 (0 Ratings)

0 Want to read0 Currently reading0 Have read

Publish Date

November 30, 1994

Publisher

John Wiley & Sons

Language

eng

Pages

1008

Description:

subjects: Mass Spectrometry, Chemistry - Industrial & Technical, Physics, Science, Science/Mathematics, Ion flow dynamics