An edition of Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces (2011)
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
By Weronika Walkosz
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Publish Date
2011
Publisher
Springer Science+Business Media, LLC
Language
eng
Pages
124
Description:
subjects: Physical organic chemistry, Materials, Microreactors, Ceramic materials, Semiconductors, Scanning electron microscopes, Chemistry, Microengineering, Atomic/Molecular Structure and Spectra, Building materials, Physical and theoretical Chemistry, Spectroscopy and Microscopy, Ceramics, Glass, Composites, Natural Methods, Materials science