An edition of Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces (2011)
Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
By Weronika Walkosz
0 (0 Ratings)
0 Want to read0 Currently reading0 Have read
0 Want to read0 Currently reading0 Have read
Publish Date
May 28, 2013
Publisher
Springer
Language
-
Pages
124
RelatedBooks