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Cover of Backscattered scanning electron microscopy and image analysis of sediments and sedimentary rocks

Backscattered Scanning Electron Microscopy and Image Analysis of Sediments and Sedimentary Rocks

By David H. Krinsley,Kenneth Pye,Boggs, Sam, Jr.,N. Keith Tovey

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Publish Date

September 15, 2005

Publisher

Cambridge University Press

Language

eng

Pages

203

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