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Cover of Drift fields and boundary conditions at grain boundaries in bipolar p/n junction silicon devices

Drift fields and boundary conditions at grain boundaries in bipolar p/n junction silicon devices

By Yueh-Hsin Chen

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Publish Date

1984

Publisher

-

Language

eng

Pages

95

1-1 of 1 Editions

Cover of Drift fields and boundary conditions at grain boundaries in bipolar p/n junction silicon devicesView Drift fields and boundary conditions at grain boundaries in bipolar p/n junction silicon devices