An edition of Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Charakterization (2012)

Handbook Of Instrumentation And Techniques For Semiconductor Nanostructure Charakterization

By Richard Haight

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Publish Date

2012

Publisher

World Scientific Publishing Company

Language

Pages

Description:

subjects: Semiconductors, Electron microscopes, X-rays, diffraction, Field ion microscopes, Nanostructured materials, Nanotechnology