An edition of Semiconductor memories (1997)

Semiconductor memories

technology, testing, and reliability

By Ashok K. Sharma

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Publish Date

1997

Publisher

IEEE, the Institute of Electrical and Electronics Engineers,Wiley-Interscience

Language

eng

Pages

462

Description:

subjects: Semiconducteurs, Memoires, Halbleiterspeicher, Semiconductor storage devices, Ordinateurs, Mocroelectronique, Semiconductors