

An edition of Fundamentals of modern VLSI devices (1998)
By Yuan Taur
Publish Date
1998
Publisher
Cambridge University Press
Language
eng
Pages
563
Description:
The great advances made in VLSI technology in recent years have been underpinned by rapid developments in the design and fabrication of CMOS and bipolar devices, particularly at the deep submicron level. This book examines in detail the basic properties and design of these devices, including chip integration, and discusses the various factors that affect their performance. The book contains many exercises, and can be used as a textbook for senior undergraduate or first-year graduate courses on microelectronics or VLSI devices. It will also be a valuable reference volume for practicing engineers involved in research and development in the electronics industry.
subjects: Bipolar transistors, Complementary Metal oxide semiconductors, Integrated circuits, Metal oxide semiconductors, Complementary, Very large scale integration, Integrated circuits, very large scale integration, MOS complémentaires, Transistors bipolaires, Circuits intégrés à très grande échelle, Silicium sur isolant, CMOS, Entwurf, VLSI, Integrerade kretsar, Halvledarkretsar