An edition of Scanning electron microscopy (1985)
physics of image formation and microanalysis
By Ludwig Reimer
Publish Date
1985
Publisher
Springer-Verlag
Language
eng
Pages
480
Description:
subjects: Scanning electron microscopy, Microscopy, Electron, Scanning, Rasterelektronenmikroskopie, Microscopie électronique à balayage, Microanalyse par émission X., Scanning Electron microscope, Scanning electron microscopes