An edition of Characterization of high Tc materials and devices by electron microscopy (2000)
Characterization of high Tc materials and devices by electron microscopy
By Stephen J. Pennycook
Publish Date
2000
Publisher
Cambridge University Press
Language
eng
Pages
399
1-6 of 6 Editions
Characterization of High Tc Materials and Devices by Electron Microscopy
Language: eng
Pages: 407
Published In: 2000
Publisher: Cambridge University Press
Characterization of High Tc Materials and Devices by Electron Microscopy
Language: eng
Published In: 2000
Publisher: Cambridge University Press
Characterization of High Tc Materials and Devices by Electron Microscopy
Language: eng
Published In: 2005
Publisher: Cambridge University Press
Characterization of High Tc Materials and Devices by Electron Microscopy
Language: eng
Published In: 2000
Publisher: Cambridge University Press
Characterization of High Tc Materials and Devices by Electron Microscopy
Language: eng
Published In: 2009
Publisher: Cambridge University Press
Language: eng
Pages: 391
Published In: 2000
Publisher: Cambridge University Press