An edition of Materials reliability in microelectronics VII (1997)

Materials reliability in microelectronics VII

symposium held March 31-April 3, 1997, San Francisco, California, U.S.A.

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Publish Date

1997

Publisher

Materials Research Society

Language

eng

Pages

457

Description:

subjects: Reliability, Congresses, Microstructure, Materials, Metallizing, Testing, Microelectronics, Materials, research, Reliability (engineering)