An edition of Analysis of residual stress by diffraction using neutron and synchrotron radiation (2003)
By Alain Lodini,M. E. Fitzpatrick
Publish Date
2003
Publisher
Taylor & Francis
Language
eng
Pages
368
Description:
subjects: Residual stresses, Neutron radiography, Synchrotron radiation, Contraintes résiduelles, Rayonnement synchrotron, Internal stress, SCIENCE, Nanoscience