An edition of Spectroscopic ellipsometry and reflectometry (1999)
Spectroscopic ellipsometry and reflectometry
a user's guide
By Harland G. Tompkins
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Publish Date
1999
Publisher
Wiley
Language
eng
Pages
238
Description:
subjects: Optical properties, Reflectometer, Materials, Surfaces (Technology), Ellipsometry, Thin films, Reflectance spectroscopy, Phase transformations (statistical physics), Surfaces (technologie), Ellipsométrie, Réflectomètres, Matériaux, Propriétés optiques, Couches minces, Espectrometria, Propriedades óticas, Filmes finos, Materiais, Dünne Schicht, Ellipsometrie, Oberflächeneigenschaft, Reflektometrie, Werkstoff