An edition of Advances in imaging and electron physics (2008)

Advances in imaging and electron physics

Optics of charged particle analyzers

By Peter W. Hawkes

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Publish Date

2010

Publisher

Academic

Language

eng

Pages

392

Description:

subjects: Optical data processing, Optoelectronic devices, Electron optics, Particle beams, Image processing, Electron microscopes, Electrons, Microscopy