Cover of Atom Probe Microscopy

An edition of Atom Probe Microscopy (2012)

Atom Probe Microscopy

By Baptiste Gault

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Publish Date

2012

Publisher

Springer New York,Imprint: Springer

Language

eng

Pages

421

Description:

subjects: Materials science, Characterization and Evaluation of Materials, Spectroscopy and Microscopy, Nanochemistry, Surfaces (Physics), Nanoscale Science and Technology, Nanotechnology, Atomic force microscopy, Scanning probe microscopy, Atom-probe field ion microscopy