Thermal-Aware Testing of Digital VLSI Circuits and Systems
An edition of Thermal-Aware Testing of Digital VLSI Circuits and Systems (2018)
By Santanu Chattopadhyay
Publish Date
2018
Publisher
Taylor & Francis Group
Language
eng
Pages
118
Description:
subjects: Integrated circuits, very large scale integration, Digital integrated circuits, Temperature measurements, Integrated circuits, Very large scale integration, Testing, Thermal properties, TECHNOLOGY & ENGINEERING, Mechanical