Next Generation HALT and HASS

Robust Design of Electronics and Systems

By Kirk A. Gray,John J. Paschkewitz

0 (0 Ratings)

1 Want to read0 Currently reading0 Have read

Publish Date

2016

Publisher

Wiley & Sons, Incorporated, John

Language

eng

Pages

296

Description:

subjects: Electronic systems, Testing, Accelerated life testing, Design and construction