An edition of Advanced VLSI Design and Testability Issues (2020)

Advanced VLSI Design and Testability Issues

By Suman Lata Tripathi,Sobhit Saxena,Sushanta Kumar Mohapatra

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Publish Date

2020

Publisher

Taylor & Francis Group

Language

eng

Pages

362

Description:

subjects: Integrated circuits, Very large scale integration, Design and construction, TECHNOLOGY, Electricity, Electronics, Circuits, General