Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies

An edition of Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies (1989)

Proceedings of the symposia on reliability of semiconductor devices and interconnection and multilevel metallization, interconnection, and contact technologies

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Publish Date

1989

Publisher

Electrochemical Society

Language

eng

Pages

495

Description:

subjects: Reliability, Congresses, Metallizing, Very large scale integration, Semiconductors, Integrated circuits, Design and construction