Test structure implementation document

DC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs)

By C. E. Schuster

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Publish Date

1995

Publisher

U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,For sale by the Supt. of Docs., U.S. G.P.O.

Language

eng

Pages

1-3 of 3 Editions

Test structure implementation document

Test structure implementation documentDC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs)

Language: eng

Pages: 88

Published In: 1995

Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.

Test structure implementation document

Test structure implementation documentDC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs)

Language: eng

Pages: 88

Published In: 1995

Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.

Test structure implementation document

Test structure implementation documentDC parametric test structures and test methods for monolithic microwave integrated circuits (MMICs)

Language: eng

Pages: 88

Published In: 1995

Publisher: U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, For sale by the Supt. of Docs., U.S. G.P.O.