Electron microprobe analysis and scanning electron microscopy in geology

Description:

Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

subjects: Petrofabric analysis,  Scanning electron microscopy,  Electron probe microanalysis,  Microprobe analysis,  Nonfiction,  Science,  Scanning electron microscopes,  Géologie,  Échantillons,  Analyse,  Analyse par microsonde,  Microscopie électronique à balayage,  Petrofabrik analiz,  Elektro mikroprob analiz,  Tarayıcı elektron mikroskopisi