

An edition of Scanning electron microscopy and x-ray microanalysis (1993)
By Robert Edward Lee
Publish Date
1993
Publisher
PTR Prentice Hall
Language
eng
Pages
458
Description:
subjects: Electron probe microanalysis, Microscopy, Electron, Scanning, Scanning electron microscopy, X-ray microanalysis, Elektronenmicroscopie, Electron Probe Microanalysis, Microscopie electronique a balayage, Microanalyse par emission X., Rontgen-microanalyse, Elektronenstrahlmikroanalyse, Rasterelektronenmikroskopie, Scanning electron microscopes