Point Defects in Semiconductors II

Experimental Aspects (Springer Series in Solid-State Sciences)

By M. Lannoo,Michel Lannoo,J. Bourgoin

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Publish Date

June 1983

Publisher

Springer

Language

eng

Pages

295

1-2 of 2 Editions

Point Defects in Semiconductors II

Language: eng

Pages: 295

Published In: June 1983

Publisher: Springer

Point defects in semiconductors

Language: eng

Published In: 1981

Publisher: Springer-Verlag