Improved infrared response technique for detecting defects and impurities in germanium and silicon p-i-n diodes

An edition of Improved infrared response technique for detecting defects and impurities in germanium and silicon p-i-n diodes (1975)

Improved infrared response technique for detecting defects and impurities in germanium and silicon p-i-n diodes

By Alvin H. Sher

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Publish Date

1975

Publisher

U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.

Language

eng

Pages

Description:

subjects: Defects, Germanium diodes, Infrared technology, Silicon diodes