An edition of 2nd European Congress on Optics Applied to Metrology (METROP) (1980)
2nd European Congress on Optics Applied to Metrology (METROP)
presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France
By European Congress on Optics Applied to Metrology Strasbourg 1979.
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Publish Date
1980
Publisher
Society of Photo-optical Instrumentation Engineers
Language
eng
Pages
228
Description: