An edition of 2000 IEEE International Workshop on Defect Based Testing (2000)
2000 IEEE International Workshop on Defect Based Testing: April 30, 2000 Montreal, Canada
Proceedings
By IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec),Yashwant K. Malaiya,Manoj Sachdev,Sankaran M. Menon,Quebec) IEEE VLSI Test Symposium (2000 : Montreal
Publish Date
August 2000
Publisher
Institute of Electrical & Electronics Enginee
Language
eng
Pages
84
Description:
subjects: Complementary Metal oxide semiconductors, Congresses, Defects, Iddq testing, Integrated circuits, Electronics engineering, Systems analysis & design, Systems management, Digital Computer Hardware, Metal oxide semiconductors, Complementary, Computers, Technology & Industrial Arts, Computer Books: General, General, Metal oxide semiconductors, Co, Computer Engineering, Testing