

An edition of X-ray microscopy and X-ray microanalysis (1960)
proceedings.
By International Symposium on X-ray Optics and X-ray Microanalysis (2nd 1959 Stockholm, Sweden)
Publish Date
1960
Publisher
Elsevier Pub. Co.
Language
eng
Pages
542
Description:
subjects: Congresses, X-ray microscopy, Microradiography