An edition of Vlsi Testing (1999)
Digital and Mixed Analogue/Digital Techniques (Circuits, Devices and Systems Series)
By Stanley L. Hurst
Publish Date
February 1999
Publisher
Institution of Electrical Engineers
Language
eng
Pages
560
Description:
subjects: Prüftechnik, VLSI, Very large scale integration, Testing, Microélectronique, Çok büyük boyutta integrasyon, Circuits intégrés à très grande échelle, Entegre devreler, Test etme, Integrated circuits, Integrated circuits, very large scale integration