An edition of Measurement and Modeling of Silicon Heterostructure Devices (2007)
Measurement and Modeling of Silicon Heterostructure Devices
By John D. Cressler
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Publish Date
2018
Publisher
Taylor & Francis Group
Language
eng
Pages
200
Description:
subjects: Mathematical models, Heterostructures, Bipolar transistors, Integrated circuits, Design and construction, Transistors, Transistors bipolaires, Modèles mathématiques, Hétérostructures, Circuits intégrés, Conception et construction, TECHNOLOGY & ENGINEERING, Electronics, Solid State, Semiconductors