An edition of Testing static random access memories (2004)
Testing Static Random Access Memories
Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing)
By Said Hamdioui
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Publish Date
March 31, 2004
Publisher
Springer
Language
eng
Pages
240
1-4 of 4 Editions
Testing Static Random Access Memories
Testing Static Random Access MemoriesDefects, Fault Models and Test Patterns
Language: eng
Published In: 2013
Publisher: Springer London, Limited
Testing Static Random Access Memories"Defects, Fault Models And Test Patterns"
Pages: 244
Published In: Dec 09, 2010
Publisher: Springer
Testing Static Random Access MemoriesDefects, Fault Models and Test Patterns (Frontiers in Electronic Testing)
Language: eng
Pages: 240
Published In: March 31, 2004
Publisher: Springer
Testing static random access memoriesdefects, fault models, and test patterns
Language: eng
Pages: 221
Published In: 2004
Publisher: Kluwer Academic