An edition of Evaluation of Advanced Semiconductor Materials by Electron Microscopy (1990)

Evaluation of Advanced Semiconductor Materials by Electron Microscopy

By David Cherns

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Publish Date

January 1, 1990

Publisher

Springer

Language

eng

Pages

420

Description:

subjects: Surfaces, Electron microscopy, Congresses, Electrons, Semiconductors, Technique, Diffraction, Medicine, Biomedicine, Biomedicine general