An edition of Two- and Three-dimensional Methods for Inspection and Metrology (2006)

Two- and three-dimensional methods for inspection and metrology IV

1-3 October, 2006, Boston, Massachusetts, USA

By Peisen S. Huang

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Publish Date

2006

Publisher

SPIE

Language

eng

Pages

Description:

subjects: Metrology, Imaging systems, Optical methods, Computer vision, Quality control, Congresses, Optical measurements, Three-dimensional display systems