Explore Books on
automatic test equipment
1-24 of 171 Books
Integration of test with design and manufacturing
Integration of test with design and manufacturing
By International Test Conference (18th 1987 Washington, D.C.)
New frontiers in testing
New frontiers in testing
By International Test Conference (1988 Washington, D.C.)
Designing, testing, and diagnostics--join them
Designing, testing, and diagnostics--join them
By International Test Conference (1993 Baltimore, Md.)
International Test Conference, 1991
International Test Conference, 1991
By International Test Conference (22nd 1991 Nashville, Tenn.)
Design-for-Test for Digital IC's and Embedded Core Systems
By Alfred Crouch
A designer's guide to built-in self-test
By Charles E. Stroud
The economics of automatic testing
By Brendan Davis
2008 IEEE 14th International Mixed-signals, Sensors, and Systems Test Workshop
2008 IEEE 14th International Mixed-signals, Sensors, and Systems Test Workshop
By IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (14th 2008 Vancouver, B.C.)
1983 IEEE ATPG Workshop proceedings
By Automatic Test Program Generation Workshop (3rd 1983 San Francisco, Calif.)
ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993
By European Test Conference (3rd 1993 Rotterdam, Netherlands)
Economic model of calibration improvements for automatic test equipment
Economic model of calibration improvements for automatic test equipment
By Stephen F. Weber
Conference record, 1982 Workshop on Industrial Applications of Machine Vision, May 3-5, 1982, Research Triangle Park, N.C
Conference record, 1982 Workshop on Industrial Applications of Machine Vision, May 3-5, 1982, Research Triangle Park, N.C
By Workshop on Industrial Applications of Machine Vision (1982 Research Triangle Park, N.C.)
Innovations in test
Innovations in test
By ATE & Instrumentation Conference West (1989 Anaheim, Calif.)
1984 Academic Forum for Test Technology, October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneaplis
1984 Academic Forum for Test Technology, October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneaplis
By Academic Forum for Test Technology (1984 Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis)
System Diagnosis and Prognosis
By Peter K. Willet
Sensor handbook for automatic test, monitoring, diagnostic, and control systems applications to military vehicles and machinery
Sensor handbook for automatic test, monitoring, diagnostic, and control systems applications to military vehicles and machinery
By Paul S. Lederer
Computer controlled testing and instrumentation
By Martin Colloms
Conference record
By Autotestcon '92 (1992 Dayton, Ohio),IEEE Instrumentation & Measurement Socie,IEEE Aerospace & Electronics Systems Soc
ETC91
By European Test Conference (2nd 1991 Munich, Germany)
Meeting the tests of time
Meeting the tests of time
By International Test Conference (20th 1989 Washington, DC)
IEEE Trial-Use Standard for Test Equipment Description Language (Tedl)
IEEE Trial-Use Standard for Test Equipment Description Language (Tedl)
By Institute of Electrical and Electronics Engineers
Nondestructive and Automated Testing for Soil and Rock Properties
By Calif.) ASTM Symposium on Nondestructive and Automated Testing for Soil and Rock Properties (1998 : San Diego