Explore Books on
automatic test equipment
1-24 of 171 Books
New frontiers in testing
New frontiers in testing
By International Test Conference (1988 Washington, D.C.)
Integration of test with design and manufacturing
Integration of test with design and manufacturing
By International Test Conference (18th 1987 Washington, D.C.)
A designer's guide to built-in self-test
By Charles E. Stroud
The economics of automatic testing
By Brendan Davis
2008 IEEE 14th International Mixed-signals, Sensors, and Systems Test Workshop
2008 IEEE 14th International Mixed-signals, Sensors, and Systems Test Workshop
By IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (14th 2008 Vancouver, B.C.)
Design-for-Test for Digital IC's and Embedded Core Systems
By Alfred Crouch
International Test Conference, 1991
International Test Conference, 1991
By International Test Conference (22nd 1991 Nashville, Tenn.)
Designing, testing, and diagnostics--join them
Designing, testing, and diagnostics--join them
By International Test Conference (1993 Baltimore, Md.)
1983 IEEE ATPG Workshop proceedings
By Automatic Test Program Generation Workshop (3rd 1983 San Francisco, Calif.)
ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993
By European Test Conference (3rd 1993 Rotterdam, Netherlands)
Economic model of calibration improvements for automatic test equipment
Economic model of calibration improvements for automatic test equipment
By Stephen F. Weber
IEEE Trial-Use Standard for Test Equipment Description Language (Tedl)
IEEE Trial-Use Standard for Test Equipment Description Language (Tedl)
By Institute of Electrical and Electronics Engineers
Nondestructive and Automated Testing for Soil and Rock Properties
By Calif.) ASTM Symposium on Nondestructive and Automated Testing for Soil and Rock Properties (1998 : San Diego
Advanced System for Automatically Detecting Faults Occurring in Bearings
By Peter W. Tse,Jacko C. Leung
Proceedings
By IEEE Workshop on Simulation & Test Generation Environments (1985 San Francisco, Calif.)
Survey of Saturn/Apollo checkout automation, spring 1965
Survey of Saturn/Apollo checkout automation, spring 1965
By L. T. Mast
IEEE standard for test equipment description language (TEDL)
IEEE standard for test equipment description language (TEDL)
By
IEEE guide to the use of ATLAS specification
IEEE guide to the use of ATLAS specification
By
IEEE standard for digital test interchange format (DTIF)
IEEE standard for digital test interchange format (DTIF)
By
Computer controlled testing and instrumentation
By Martin Colloms
ETC91
By European Test Conference (2nd 1991 Munich, Germany)