Integration of test with design and manufacturing

proceedings : International Test Conference, 1987, September 1,2,3, 1987, Sheraton Washington Hotel, Washington, D.C.

By International Test Conference (18th 1987 Washington, D.C.)

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Publish Date

1987

Publisher

Computer Society Press of the IEEE,Order from Computer Society of the IEEE

Language

eng

Pages

1151

Description:

subjects: Automatic test equipment, Circuits, Congresses, Electronic digital computers, Integrated circuits, Semiconductors, Testing