Tomeki

Explore Books on
calibration

1-24 of 659 Books

View Calibration of x-ray and gamma-ray measuring instruments By Paul J. Lamperti

Calibration of x-ray and gamma-ray measuring instruments

Calibration of x-ray and gamma-ray measuring instruments

By Paul J. Lamperti

View Recommended Practice By American Institute of Aeronautics and As
Cover of Recommended Practice by american institute of aeronautics and as

Recommended Practice

By American Institute of Aeronautics and As

View Basic Metrology for ISO 9000 Certification By G. M. S. de Silva
Cover of Basic Metrology for ISO 9000 Certification by g. m. s. de silva

Basic Metrology for ISO 9000 Certification

By G. M. S. de Silva

View Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems By James E. Potzick

Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems

Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems

By James E. Potzick

View Calibration of a 90 ̊V-notch weir using parameters other than upstream head By Robert Eli

Calibration of a 90 ̊V-notch weir using parameters other than upstream head

Calibration of a 90 ̊V-notch weir using parameters other than upstream head

By Robert Eli

View Post-launch calibration of satellite sensors By Amelia M. Budge,Stanley A. Morain
Cover of Post-launch calibration of satellite sensors by amelia m. budge,stanley a. morain

Post-launch calibration of satellite sensors

By Amelia M. Budge,Stanley A. Morain

View Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems By Carol F. Vezzetti

Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems

Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems

By Carol F. Vezzetti

View National Voluntary Laboratory Accreditation Program By NVLAP (Program : U.S.)

National Voluntary Laboratory Accreditation Program

National Voluntary Laboratory Accreditation Program

By NVLAP (Program : U.S.)

View Beam-Based Correction and Optimization for Accelerators By Xiaobiao Huang

Beam-Based Correction and Optimization for Accelerators

Beam-Based Correction and Optimization for Accelerators

By Xiaobiao Huang

View Traceable temperatures By J. V. Nicholas
Cover of Traceable temperatures by j. v. nicholas

Traceable temperatures

By J. V. Nicholas

View Traffic Simulation and Data By Winnie Daamen,Christine Buisson,Serge P. Hoogendoorn

Traffic Simulation and Data

Traffic Simulation and Data

By Winnie Daamen,Christine Buisson,Serge P. Hoogendoorn

View Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems By Carol F. Vezzetti

Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

Antireflecting-chromium linewidth standard, SRM 475, for calibration of optical microscope linewidth measuring systems

By Carol F. Vezzetti

View Quality assurance of U.S. Geological Survey stream current meters By E. F. Hubbard

Quality assurance of U.S. Geological Survey stream current meters

Quality assurance of U.S. Geological Survey stream current meters

By E. F. Hubbard

View CCT-K3 By B. W. Mangum

CCT-K3

CCT-K3

By B. W. Mangum

View NIST multifunction calibration system By Nile Oldham

NIST multifunction calibration system

NIST multifunction calibration system

By Nile Oldham

View Post-launch calibration of the visible and near infrared channels of the advanced very high resolution radiometer on NOAA-7, -9, and -11 spacecraft By C. R. Nagaraja Rao

Post-launch calibration of the visible and near infrared channels of the advanced very high resolution radiometer on NOAA-7, -9, and -11 spacecraft

Post-launch calibration of the visible and near infrared channels of the advanced very high resolution radiometer on NOAA-7, -9, and -11 spacecraft

By C. R. Nagaraja Rao

View Alpha-particle calibrations By J. M. R. Hutchinson

Alpha-particle calibrations

Alpha-particle calibrations

By J. M. R. Hutchinson

View Calibration of ground-based microwave radiometers for atmospheric remote sensing By Martin T. Decker

Calibration of ground-based microwave radiometers for atmospheric remote sensing

Calibration of ground-based microwave radiometers for atmospheric remote sensing

By Martin T. Decker

View Solid-state voltage standard performance and design guidelines By Bruce F. Field

Solid-state voltage standard performance and design guidelines

Solid-state voltage standard performance and design guidelines

By Bruce F. Field

View On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond By Andrej Rumiantsev
Cover of On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond by andrej rumiantsev

On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond

By Andrej Rumiantsev

View Imaging beyond the pinhole camera By Kostas Daniilidis,Reinhard Klette
Cover of Imaging beyond the pinhole camera by kostas daniilidis,reinhard klette

Imaging beyond the pinhole camera

By Kostas Daniilidis,Reinhard Klette

View Calibration of industrial robot manipulators By Patrick Maurine

Calibration of industrial robot manipulators

Calibration of industrial robot manipulators

By Patrick Maurine

View Calibrating two 6-port reflectometers with only one impedance standard By Cletus A. Hoer

Calibrating two 6-port reflectometers with only one impedance standard

Calibrating two 6-port reflectometers with only one impedance standard

By Cletus A. Hoer

View Establishment of calibration base lines By Joseph F. Dracup

Establishment of calibration base lines

Establishment of calibration base lines

By Joseph F. Dracup