1-8 of 8 Books

Multi-threshold CMOS digital circuits
By Mohab Anis,Mohamed Elmasry

Leakage in Nanometer CMOS Technologies
By Anantha P. Chandrakasan

Gate Stack and Silicide Issues in Silicon Processing II Symposium Held April 17-19, 2001, San Francisco, California, U.S.A
By S. A. Campbell

Gate stack and silicide issues in silicon processing
By Symposium on Gate Stack and Silicide Issues in Silicon Processing (2000 San Francisco, CA)
Mesures de pertes par effluves, comparaison de fils d'aluminium oxydés et non oxydés
Mesures de pertes par effluves, comparaison de fils d'aluminium oxydés et non oxydés
By Jacques Monney
Ein beitrag zur definition, Berechnung und Messung von Streuung
Ein beitrag zur definition, Berechnung und Messung von Streuung
By J. L. La Cour
The electrical leak location method for geomembrane liners
The electrical leak location method for geomembrane liners
By Glenn T Darilek
Conference on International Medium Voltage Earthing Practices, 21-23 March, 1972
Conference on International Medium Voltage Earthing Practices, 21-23 March, 1972
By Conference on International Medium Voltage Earthing Practices, Institution of Electrical Engineers, London 1972